SICM, or Scanning ion conductance microscopy is a technique that uses probe methods as well as the increase in resistance that occurs when an electrolyte filled item is presented to a surface with poor ion conductance. Any increase in resistance can be examined before physical contact is made between the scanning probe tip and the sample at hand. The method is popular in investigation of the topography of fragile samples, particularly when it comes to examination living cells.
Scanning ion conductance has shown its worth in several different applications. This includes high-resolution as well as long-time span imaging for changes within cell volume as well as living cells. SICM has also been used in conjunction with varying methods to include fluorescence microscopy and patch clamping. Protein functions as well as proteins themselves can be examined perfectly this way.
Many feel that a combination of scanning ion conductance and ion selected micro-electrodes allows them to better watch any localized ion activity in relation to a living cell.